Compact Models and Performance Investigations for by Rohit Dhiman, Rajeevan Chandel
By Rohit Dhiman, Rajeevan Chandel
The e-book offers an in depth research of concerns regarding sub-threshold interconnect functionality from the viewpoint of analytical technique and layout ideas. specific emphasis is laid at the functionality research of coupling noise and variability concerns in sub-threshold area to boost effective compact types. The proposed analytical method supplies actual perception of the parameters affecting the temporary habit of coupled interconnects. Remedial layout recommendations also are steered to mitigate the influence of coupling noise. the consequences of cord width, spacing among the wires, cord size are completely investigated. additionally, the impression of parameters like driving force energy on height coupling noise has additionally been analyzed. procedure, voltage and temperature adaptations are widespread elements affecting sub-threshold layout and feature additionally been investigated. the method variability research has been performed utilizing parametric research, approach nook research and Monte Carlo method. The ebook additionally offers a qualitative precis of the paintings said within the literature by way of quite a few researchers within the layout of electronic sub-threshold circuits. This publication may be of curiosity for researchers and graduate scholars with deeper insights into sub-threshold interconnect types particularly. during this experience, this ebook will top healthy as a textual content ebook and/or a reference booklet for college students who're initiated within the quarter of study and complicated classes in nanotechnology, interconnect layout and modeling.
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Extra info for Compact Models and Performance Investigations for Subthreshold Interconnects
7). Both c21 and c22 include the effect of coupling capacitance. The coupling capacitance thus affects the propagation delay. This delay uncertainty in the propagation delay can be eliminated if MN1 and MN2 both have the same ratio of output current drive ðBn1 =Bn2 Þ to the corresponding intrinsic load capacitances ðC1 =C2 Þ. Under such conditions, the coupling capacitance has no effect on the output voltage waveforms V1 and V2. However, this condition is difﬁcult to be realized in practical CMOS VLSI circuits.
7) are deﬁned as c21 ¼ ðC2 þ Cc ÞBn1 þ Cc Bn2 C1 C2 þ Cc ðC1 þ C2 Þ ð4:8Þ c22 ¼ ðC1 þ Cc ÞBn2 þ Cc Bn1 C1 C2 þ Cc ðC1 þ C2 Þ ð4:9Þ The effect of coupling can be seen in Eqs. 7). Both c21 and c22 include the effect of coupling capacitance. The coupling capacitance thus affects the propagation delay. This delay uncertainty in the propagation delay can be eliminated if MN1 and MN2 both have the same ratio of output current drive ðBn1 =Bn2 Þ to the corresponding intrinsic load capacitances ðC1 =C2 Þ.
It is assessed that repeater insertion improves throughput. 5 V supply, for 2 Gbps throughput. The results are compared with SPICE simulations and show a good agreement. The possibility of applying the buffer insertion technique to reduce power dissipation and delay in interconnects in voltage-scaled environment has been carried out in [160, 161]. Analytical approaches for optimum design and optimum number of buffers in low-power environment have been developed. Buffer sizing for minimum power and delay in voltage-scaled environment has also been carried out.